Correlation of In-Process Monitoring Data and Defects in X-Ray CT for AM Swirler
EOS Monitoring System - A Cost Effective Solution for Quality Assurance
Free Whitepaper
This study shows that process instability can be reflected as extreme hot spots, which can be detected by the monitoring system.
Download the whitepaper "Correlation of In-Process Monitoring Data and Defects" and get deep insight about the EOSTATE Exposure OT monitoring system.
The EOSTATE Exposure OT monitoring system can be used to identify defects. This study shows that process instability can be reflected as extreme hot spots, which can be detected by the monitoring system. These hot spots have been correlated to porosity in X-ray CT scanning. The EOSTATE online monitoring solutions allow part quality to be evaluated in situ during the building process.
This whitepaper gives information about:
- The assessment of the sensitivity of EOSTATE Exposure OT and EOSTATE MeltPool monitoring system in registering variations in melt pool energy density when processing EOS NickelAlloy IN625 on EOS M 290
- The correlation of defects based on in-process monitoring data and CT scanning
- The application of in-process monitoring for quality assurance in a serial production scenario